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ASTM F1262M-14
- Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
- standard by ASTM International, 06/01/2014
- Publisher: ASTM
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1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 10³ Gy (matl.)/s.
1.1.1 Discussion-This document is intended to be a guide to determine upset threshold, and is not intended to be a stand-alone document.
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