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ASTM F615M-95(2013)

Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)
standard by ASTM International, 05/01/2013
Publisher: ASTM

$22.00$44.00

Description

1.1 This practice covers procedures for determining operating regions that are safe from metallization burnout induced by current pulses of less than 1-s duration.

Note 1-In this practice, “metallization” refers to metallic layers on semiconductor components such as interconnect patterns on integrated circuits. The principles of the practice may, however, be extended to nearly any current-carrying path. The term “burnout” refers to either fusing or vaporization.

Product Details

Published:: 05/01/2013
Number of Pages:: 5
File Size:: 1 file , 99 KB

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