• ASTM F637-85(1994)e1
Provide PDF Format

Learn More

ASTM F637-85(1994)e1

  • Standard Specification for Format, Physical Properties, and Test Methods for 19 and 35 mm Testable Tape Carrier for Perimeter Tape Carrier-Bonded Semiconductor Devices
  • standard by ASTM International, 01/01/1994
  • Publisher: ASTM

$26.00$52.80


1.1 This specification covers standard formats for testable semiconductor lead carrier tape suitable for hybrid applications.

1.2 This standard specifies tape width, configuration, and location of guide perforations ("sprocket holes"), location of lead pattern frames on tape, lead pattern window size, and placement of outer lead bond and electrical test pad areas in the lead pattern.

1.3 The values stated in inch-pound units are to be regarded as the standard. The values given in parentheses are for information only.

1.4 The following hazard caveat pertains only to the test method portion, Section 7 of this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Related Products

ASTM D5236-99ae1

ASTM D5236-99ae1

Standard Test Method for Distillation of Heavy Hydrocarbon Mixtures (Vacuum Potstill Method)..

$30.00 $60.00

ASTM D6839-15

ASTM D6839-15

Standard Test Method for Hydrocarbon Types, Oxygenated Compounds and Benzene in Spark Ignition En..

$26.00 $52.80

ASTM D2467-15

ASTM D2467-15

Standard Specification for Poly(Vinyl Chloride) (PVC) Plastic Pipe Fittings, Schedule 80..

$22.00 $44.00

ASTM F1114-06

ASTM F1114-06

Standard Specification for Heat Sanitizing Commercial Pot, Pan, and Utensil Station Rack Type Water-..

$26.00 $52.80