• ASTM F637-85(1994)e1
Provide PDF Format

Learn More

ASTM F637-85(1994)e1

  • Standard Specification for Format, Physical Properties, and Test Methods for 19 and 35 mm Testable Tape Carrier for Perimeter Tape Carrier-Bonded Semiconductor Devices
  • standard by ASTM International, 01/01/1994
  • Publisher: ASTM

$26.00$52.80


1.1 This specification covers standard formats for testable semiconductor lead carrier tape suitable for hybrid applications.

1.2 This standard specifies tape width, configuration, and location of guide perforations ("sprocket holes"), location of lead pattern frames on tape, lead pattern window size, and placement of outer lead bond and electrical test pad areas in the lead pattern.

1.3 The values stated in inch-pound units are to be regarded as the standard. The values given in parentheses are for information only.

1.4 The following hazard caveat pertains only to the test method portion, Section 7 of this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Related Products

ASTM C1101/C1101M-95

ASTM C1101/C1101M-95

Standard Test Methods for Classifying the Flexibility or Rigidity of Mineral Fiber Blanket and Board..

$23.00 $46.80

ASTM D6827-02

ASTM D6827-02

Standard Test Method for Zinc Analysis of Floor Polishes and Floor Polish Polymers By Flame Atomic A..

$23.00 $46.80

ASTM B380-97

ASTM B380-97

Standard Test Method of Corrosion Testing of Decorative Electrodeposited Coatings by the Corrodkote ..

$23.00 $46.80

ASTM D5827-09

ASTM D5827-09

Standard Test Method for Analysis of Engine Coolant for Chloride and Other Anions by Ion Chromatogra..

$26.00 $52.80