• ASTM F637-85(1994)e1
Provide PDF Format

Learn More

ASTM F637-85(1994)e1

  • Standard Specification for Format, Physical Properties, and Test Methods for 19 and 35 mm Testable Tape Carrier for Perimeter Tape Carrier-Bonded Semiconductor Devices
  • standard by ASTM International, 01/01/1994
  • Publisher: ASTM

$26.00$52.80


1.1 This specification covers standard formats for testable semiconductor lead carrier tape suitable for hybrid applications.

1.2 This standard specifies tape width, configuration, and location of guide perforations ("sprocket holes"), location of lead pattern frames on tape, lead pattern window size, and placement of outer lead bond and electrical test pad areas in the lead pattern.

1.3 The values stated in inch-pound units are to be regarded as the standard. The values given in parentheses are for information only.

1.4 The following hazard caveat pertains only to the test method portion, Section 7 of this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Related Products

ASTM PS109-97

ASTM PS109-97

Guide for Training of Persons Who Have Access to Health Information (Withdrawn 1998)..

$23.00 $46.80

ASTM D5955-02

ASTM D5955-02

Standard Test Methods for Estimating Contribution of Environmental Tobacco Smoke to Respirable Suspe..

$26.00 $52.80

ASTM D772-86(2000)

ASTM D772-86(2000)

Standard Test Method for Evaluating Degree of Flaking (Scaling) of Exterior Paints..

$23.00 $46.80

ASTM D5785-95(2000)

ASTM D5785-95(2000)

Standard Test Method for (Analytical Procedure) for Determining Transmissivity of Confined Nonleaky ..

$26.00 $52.80