• ASTM F637-85(1994)e1
Provide PDF Format

Learn More

ASTM F637-85(1994)e1

  • Standard Specification for Format, Physical Properties, and Test Methods for 19 and 35 mm Testable Tape Carrier for Perimeter Tape Carrier-Bonded Semiconductor Devices
  • standard by ASTM International, 01/01/1994
  • Publisher: ASTM

$26.00$52.80


1.1 This specification covers standard formats for testable semiconductor lead carrier tape suitable for hybrid applications.

1.2 This standard specifies tape width, configuration, and location of guide perforations ("sprocket holes"), location of lead pattern frames on tape, lead pattern window size, and placement of outer lead bond and electrical test pad areas in the lead pattern.

1.3 The values stated in inch-pound units are to be regarded as the standard. The values given in parentheses are for information only.

1.4 The following hazard caveat pertains only to the test method portion, Section 7 of this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Related Products

ASTM D3943-10

ASTM D3943-10

Standard Test Method for Total Molybdenum in Fresh Alumina-Base Catalysts..

$23.00 $46.80

ASTM F2096-02e1

ASTM F2096-02e1

Standard Test Method for Detecting Gross Leaks in Medical Packaging by Internal Pressurization (Bubb..

$26.00 $52.80

ASTM A213/A213M-01a

ASTM A213/A213M-01a

Standard Specification for Seamless Ferritic and Austenitic Alloy-Steel Boiler, Superheater, and Hea..

$26.00 $52.80

ASTM D6406-99(2014)

ASTM D6406-99(2014)

Standard Test Method for Analysis of Sugar in Vegetable Tanning Materials..

$22.00 $44.00