• ASTM F637-85(1994)e1
Provide PDF Format

Learn More

ASTM F637-85(1994)e1

  • Standard Specification for Format, Physical Properties, and Test Methods for 19 and 35 mm Testable Tape Carrier for Perimeter Tape Carrier-Bonded Semiconductor Devices
  • standard by ASTM International, 01/01/1994
  • Publisher: ASTM

$26.00$52.80


1.1 This specification covers standard formats for testable semiconductor lead carrier tape suitable for hybrid applications.

1.2 This standard specifies tape width, configuration, and location of guide perforations ("sprocket holes"), location of lead pattern frames on tape, lead pattern window size, and placement of outer lead bond and electrical test pad areas in the lead pattern.

1.3 The values stated in inch-pound units are to be regarded as the standard. The values given in parentheses are for information only.

1.4 The following hazard caveat pertains only to the test method portion, Section 7 of this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Related Products

ASTM A974-97(2003)

ASTM A974-97(2003)

Standard Specification for Welded Wire Fabric Gabions and Gabion Mattresses (Metallic Coated or Poly..

$26.00 $52.80

ASTM C1293-95

ASTM C1293-95

Standard Test Method for Determination of Length Change of Concrete Due to Alkali-Silica Reaction..

$26.00 $52.80

ASTM F1687-97(2003)

ASTM F1687-97(2003)

Standard Guide for Terminology and Indices to Describe Oiling Conditions on Shorelines..

$26.00 $52.80

ASTM D6226-15

ASTM D6226-15

Standard Test Method for Open Cell Content of Rigid Cellular Plastics..

$22.00 $44.00