• ASTM F637-85(1994)e1
Provide PDF Format

Learn More

ASTM F637-85(1994)e1

  • Standard Specification for Format, Physical Properties, and Test Methods for 19 and 35 mm Testable Tape Carrier for Perimeter Tape Carrier-Bonded Semiconductor Devices
  • standard by ASTM International, 01/01/1994
  • Publisher: ASTM

$26.00$52.80


1.1 This specification covers standard formats for testable semiconductor lead carrier tape suitable for hybrid applications.

1.2 This standard specifies tape width, configuration, and location of guide perforations ("sprocket holes"), location of lead pattern frames on tape, lead pattern window size, and placement of outer lead bond and electrical test pad areas in the lead pattern.

1.3 The values stated in inch-pound units are to be regarded as the standard. The values given in parentheses are for information only.

1.4 The following hazard caveat pertains only to the test method portion, Section 7 of this specification. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Related Products

ASTM D3996-02

ASTM D3996-02

Standard Performance Specification for Knit Swimwear Fabrics..

$23.00 $46.80

ASTM F712-06(2011)

ASTM F712-06(2011)

Standard Test Methods and Specifications for Electrically Insulating Plastic Guard Equipment for Pr..

$22.00 $44.00

ASTM C985-15

ASTM C985-15

Standard Specification for Nonreinforced Concrete Specified Strength Culvert, Storm Drain, and Sew..

$22.00 $44.00

ASTM D4242-91(1995)e1

ASTM D4242-91(1995)e1

Standard Test Method for Inclined Plate Flow for Thermosetting Coating Powders..

$23.00 $46.80