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  • ATIS T1.TR.48-1996
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ATIS T1.TR.48-1996

  • Test Patterns for DS0 and Synchronous Digital Data Circuits
  • standard by Alliance for Telecommunication Industry Solutions, 06/01/1996
  • Publisher: ATIS

$30.00$60.00


This report documents the various test patterns used to qualify and troubleshoot both DS0 and Synchronous Digital Data Circuits.

Product Details

Published:
06/01/1996
File Size:
1 file , 34 KB

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