Provide PDF Format
JEDEC JEP128
- GUIDE FOR STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER LEVEL ELECTRICAL TESTING
- standard by JEDEC Solid State Technology Association, 11/01/1996
- Publisher: JEDEC
$26.00$51.00
This guide was developed to expedite inter-laboratory experiments used to evaluate or develop standard test methods that involve test-structure measurements or tests. It also facilitates, generally, any electrical tests that require wafer-probe card to make electrical contact to test structures. Widespread use of this guide will afford the efficient and cost-effective use of water-probe test stations because of the need for fewer probe cards and probe-card changes to accommodate the various test structures that may need to be tested.
Related Products
JEDEC JEP151
, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power ..
$31.00 $62.00
JEDEC J-STD-609
MARKING AND LABELING OF COMPONENTS, PCBs AND PCBAs TO IDENTIFY LEAD (Pb), Pb-FREE AND OTHER ATTRIBUT..
$30.00 $59.00