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JEDEC JEP138
- USER GUIDELINES FOR IR THERMAL IMAGING DETERMINATION OF DIE TEMPERATURE
- standard by JEDEC Solid State Technology Association, 09/01/1999
- Publisher: JEDEC
$27.00$53.00
The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance.
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