• JEDEC JEP148B
Provide PDF Format

Learn More

JEDEC JEP148B

  • RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
  • standard by JEDEC Solid State Technology Association, 01/01/2014
  • Publisher: JEDEC

$39.00$78.00


A concept is outlined, which proactively integrates qualification into the development process and provides a systematic procedure as support tool to development and gives early focus on required activities. It converts requirements for a product into measures of development and qualification in combination with a risk and opportunity assessment step and accompanies the development process as guiding and recording tool for advanced quality planning and confirmation. The collected data enlarge the knowledge database for DFR / BIR (design for reliability / building-in reliability) to be used for future projects. The procedure challenges and promotes teamwork of all involved disciplines.

Related Products

JEDEC JESD 482-A (R2002)

JEDEC JESD 482-A (R2002)

LIST OF PREFERRED VALUES FOR USE ON VARIOUS TYPES OF SMALL SIGNAL AND REGULATOR DIODES..

$24.00 $48.00

JEDEC JESD 82-24

JEDEC JESD 82-24

DEFINITION OF the SSTUB32865 28-bit 1:2 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS..

$36.00 $72.00

JEDEC JESD235

JEDEC JESD235

HIGH BANDWIDTH MEMORY (HBM) DRAM..

$96.00 $191.00

JEDEC JESD220-2

JEDEC JESD220-2

UNIVERSAL FLASH STORAGE (UFS) CARD EXTENSION..

$31.00 $62.00