Provide PDF Format
JEDEC JEP163
- SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS
- standard by JEDEC Solid State Technology Association, 09/01/2015
- Publisher: JEDEC
$36.00$72.00
This publication is intended as a guideline to develop and establish conditions for burn-in and life test of MIL-PRF-38535 QML integrated circuits. These guidelines are intended to provide manufacturers with a consistent means of defining burn-in and life test stress and electrical test requirements acceptable to user organizations and for the development of Standard Military Drawings.
Related Products
JEDEC JESD 482-A (R2002)
LIST OF PREFERRED VALUES FOR USE ON VARIOUS TYPES OF SMALL SIGNAL AND REGULATOR DIODES..
$24.00 $48.00
JEDEC JESD 82-24
DEFINITION OF the SSTUB32865 28-bit 1:2 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS..
$36.00 $72.00
