Provide PDF Format
JEDEC JESD 12-2
- ADDENDUM No. 2 to JESD12 - STANDARD FOR CELL-BASED INTEGRATED CIRCUIT BENCHMARK SET
- Amendment by JEDEC Solid State Technology Association, 02/01/1986
- Publisher: JEDEC
$39.00$78.00
The purpose of these benchmarks is to provide a common set of high level functions that serve as vehicles for comparing the performance of cell-based ICs implemented in any technology using any internal structure. JESD12-2 extends the gate array benchmark set (JESD12) to cell-based ICs.
Related Products
JEDEC JESD22-A100-A
Solid State Devices, Testing Quality and Reliability - Test Method A100: Cycled Temperature Humidity..
$47.00 $93.00
JEDEC JESD87
STANDARD TEST STRUCTURE FOR RELIABILITY ASSESSMENT OF AlCu METALLIZATIONS WITH BARRIER MATERIALS..
$27.00 $54.00
JEDEC JESD51-9
TEST BOARDS FOR AREA ARRAY SURFACE MOUNT PACKAGE THERMAL MEASUREMENTS..
$30.00 $60.00