• JEDEC JESD 22-A121A (R2014)
Provide PDF Format

Learn More

JEDEC JESD 22-A121A (R2014)

  • MEASURING WHISKER GROWTH ON TIN AND TIN ALLOY SURFACE FINISHES
  • standard by JEDEC Solid State Technology Association, 07/01/2008
  • Publisher: JEDEC

$37.00$74.00


The predominant terminal finishes on electronic components have been Sn-Pb alloys. As the industry moves toward Pb-free components and assembly processes, the predominant terminal finish materials will be pure Sn and alloys of Sn, including Sn-Bi and Sn-Ag. Pure Sn and Sn-based alloy electrodeposits and solder-dipped finishes may grow tin whiskers, which could electrically short across component terminals or break off the component and degrade the performance of electrical or mechanical parts.

Related Products

JEDEC JESD219A

JEDEC JESD219A

Solid-State Drive (SSD) Endurance Workloads..

$34.00 $67.00

JEDEC JEP119A

JEDEC JEP119A

A PROCEDURE FOR EXECUTING SWEAT..

$37.00 $74.00

JEDEC JESD 82-26

JEDEC JESD 82-26

DEFINITION OF THE SSTUB32868 REGISTERED BUFFER WITH PARITY FOR 2R x 4 DDR2 RDIMM APPLICATIONS..

$37.00 $74.00

JEDEC JESD15-4

JEDEC JESD15-4

DELPHI COMPACT THERMAL MODEL GUIDELINE..

$34.00 $67.00