• JEDEC JESD 22-B114
Provide PDF Format

Learn More

JEDEC JESD 22-B114

  • MARK LEGIBILITY
  • standard by JEDEC Solid State Technology Association, 03/01/2008
  • Publisher: JEDEC

$27.00$54.00


This standard describes a nondestructive test to assess solid state device mark legibility. The specification applies only to solid state devices that contain markings, regardless of the marking method. It does not define what devices must be marked or the method in which the device is marked, i.e., ink, laser, etc. The standard is limited in scope to the legibility requirements of solid state devices, and does not replace related reference documents listed in this standard.

Related Products

JEDEC JESD 482-A (R2002)

JEDEC JESD 482-A (R2002)

LIST OF PREFERRED VALUES FOR USE ON VARIOUS TYPES OF SMALL SIGNAL AND REGULATOR DIODES..

$24.00 $48.00

JEDEC JESD 82-24

JEDEC JESD 82-24

DEFINITION OF the SSTUB32865 28-bit 1:2 REGISTERED BUFFER WITH PARITY FOR DDR2 RDIMM APPLICATIONS..

$36.00 $72.00

JEDEC JESD235

JEDEC JESD235

HIGH BANDWIDTH MEMORY (HBM) DRAM..

$96.00 $191.00

JEDEC JESD220-2

JEDEC JESD220-2

UNIVERSAL FLASH STORAGE (UFS) CARD EXTENSION..

$31.00 $62.00