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JEDEC JESD 23

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This standard specifies a collection of procedures for testing and character designation of liquid crystal devices.

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STANDARD TEST STRUCTURE FOR RELIABILITY ASSESSMENT OF AlCu METALLIZATIONS WITH BARRIER MATERIALS..

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INTEGRATED CIRCUIT THERMAL MEASUREMENT METHOD - ELECTRICAL TEST METHOD (SINGLE SEMICONDUCTOR DEVICE)..

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PRECONDITIONING OF PLASTIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING..

$30.00 $59.00

Embedded Multi-media card (e*MMC), Electrical Standard (4.5 Device)..

$142.00 $284.00