Provide PDF Format
JEDEC JESD 35-1
- ADDENDUM No. 1 to JESD35 - GENERAL GUIDELINES FOR DESIGNING TEST STRUCTURES FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
- standard by JEDEC Solid State Technology Association, 09/01/1995
- Publisher: JEDEC
$34.00$67.00
This addendum expands the usefulness of the Standard 35 (JESD35) by detailing the various sources of measurement error that could effect the test results obtained by the ramped tests described in JESD35. Each source of error is described and its implications on test structure design is noted. This addendum can be used as a guide when designing test structures for the qualification and characterization of thin oxide reliability, specifically, by implementing accelerated voltage or current ramp tests.
Related Products
JEDEC JEP151
, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power ..
$31.00 $62.00
JEDEC JESD87
STANDARD TEST STRUCTURE FOR RELIABILITY ASSESSMENT OF AlCu METALLIZATIONS WITH BARRIER MATERIALS..
$27.00 $54.00
JEDEC JESD 12-4
ADDENDUM No. 4 to JESD12 - METHOD OF SPECIFICATION OF PERFORMANCE PARAMETERS FOR CMOS SEMICUSTOM INT..
$30.00 $60.00