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JEDEC JESD 435 (R2009)
- STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS
- standard by JEDEC Solid State Technology Association, 04/01/1976
- Publisher: JEDEC
$31.00$62.00
This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435
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