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  • JEDEC JESD 435 (R2009)
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JEDEC JESD 435 (R2009)

  • STANDARD FOR THE MEASUREMENT OF SMALL-SIGNAL TRANSISTOR SCATTERING PARAMETERS
  • standard by JEDEC Solid State Technology Association, 04/01/1976
  • Publisher: JEDEC

$31.00$62.00


This standard specifies the standard for the measurement of small-signal transistor scattering parameters. Formerly known as RS-435 and/or EIA-435

Product Details

Published:
04/01/1976
Number of Pages:
23
File Size:
1 file , 620 KB

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