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JEDEC JESD22-A100-A

Solid State Devices, Testing Quality and Reliability - Test Method A100: Cycled Temperature Humidity Bias Life Test
standard by JEDEC Solid State Technology Association, 01/01/1989
Publisher: JEDEC

$47.00$93.00

Product Details

LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM STANDARD..

$58.00 $116.00

CYCLED TEMPERATURE HUMIDITY BIAS LIFE TEST..

$27.00 $53.00

IPC/JEDEC-9704: Printed Wiring Board (PWB) Strain Gage Test Guideline..

$37.00 $74.00

NAND Flash Interface Interoperability..

$37.00 $74.00