• JEDEC JESD22-B111
Provide PDF Format

Learn More

JEDEC JESD22-B111

  • BOARD LEVEL DROP TEST METHOD OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTS
  • standard by JEDEC Solid State Technology Association, 07/01/2003
  • Publisher: JEDEC

$31.00$62.00


This Board Level Drop Test Method is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize the test board and test methodology to provide a reproducible assessment of the drop test performance of surface mounted components while duplicating the failure modes normally observed during product level test.

Related Products

JEDEC JESD 209B

JEDEC JESD 209B

LOW POWER DOUBLE DATA RATE (LPDDR) SDRAM STANDARD..

$58.00 $116.00

JEDEC JESD22-A100D

JEDEC JESD22-A100D

CYCLED TEMPERATURE HUMIDITY BIAS LIFE TEST..

$27.00 $53.00

JEDEC JS 9704

JEDEC JS 9704

IPC/JEDEC-9704: Printed Wiring Board (PWB) Strain Gage Test Guideline..

$37.00 $74.00

JEDEC JESD230A

JEDEC JESD230A

NAND Flash Interface Interoperability..

$37.00 $74.00