• JEDEC JESD221
Provide PDF Format

Learn More

JEDEC JESD221

  • Alpha Radiation Measurement in Electronic Materials
  • standard by JEDEC Solid State Technology Association, 05/01/2011
  • Publisher: JEDEC

$37.00$74.00


The purpose of this document is to specify the recommended method for measuring alphaemissivity in materials utilized in the manufacturing of semiconductors. The method specificallyapplies to gas proportional instruments and designates recommended instrument settings. Inaddition, the method discusses operation of ionization counters. The document also recommendsmethods for determining sample size and for evaluating instrument background accurately.Treatment of data is also outlined, including identification and elimination of systematic errors.The calculation of results and detection limits is detailed with examples in the annexes. Astandard format for reporting results is specified.

Related Products

JEDEC JEP166

JEDEC JEP166

JC-42.6 MANUFACTURER IDENTIFICATION (ID) CODE FOR LOW POWER MEMORIES..

$36.00 $72.00

JEDEC JESD10 (R2002)

JEDEC JESD10 (R2002)

LOW FREQUENCY POWER TRANSISTORS..

$96.00 $191.00

JEDEC JESD12

JEDEC JESD12

SEMICUSTOM INTEGRATED CIRCUITS (FORMERLY PUBLISHED AS STANDARD FOR GATE ARRAY BENCHMARK SET)..

$27.00 $54.00

JEDEC JESD79-3-3

JEDEC JESD79-3-3

Addendum No. 1 to 3D Stacked SDRAM..

$58.00 $116.00