Provide PDF Format
JEDEC JESD237
- Reliability Qualification of Power Amplifier Modules
- standard by JEDEC Solid State Technology Association, 03/01/2014
- Publisher: JEDEC
$34.00$67.00
This standard is intended to identify a core set of qualification tests that apply specifically for Power Amplifier Modules and their primary application in mobile devices such as cellular phones. This standard is intended to describe specific stresses and failure mechanisms that are specific to compound semiconductors and power amplifier modules. It is intended to establish more meaningful and efficient qualification testing.
Related Products
JEDEC JESD24-12
THERMAL IMPEDANCE MEASUREMENT FOR INSULATED GATE BIPOLAR TRANSISTORS - (Delta VCE(on) Method)..
$28.00 $56.00
JEDEC JESD84-B45
Embedded Multi-media card (e*MMC), Electrical Standard (4.5 Device)..
$142.00 $284.00
JEDEC JEP65 (R1999)
TEST PROCEDURES FOR VERIFICATION OF MAXIMUM RATINGS OF POWER TRANSISTORS..
$34.00 $67.00