Provide PDF Format
JEDEC JESD247
- Multi-wire Multi-level I/O Standard
- standard by JEDEC Solid State Technology Association, 06/01/2016
- Publisher: JEDEC
$34.00$67.00
This standard defines the DC and AC operating conditions, I/O impedances, termination characteristics, and compliance test methods of I/O drivers and receivers used in multi-wire, multi-level signaling interfaces. The multi-wire interfaces defined by this specification all utilize quaternary signal levels.
Related Products
JEDEC JESD24-12
THERMAL IMPEDANCE MEASUREMENT FOR INSULATED GATE BIPOLAR TRANSISTORS - (Delta VCE(on) Method)..
$28.00 $56.00
JEDEC JESD84-B45
Embedded Multi-media card (e*MMC), Electrical Standard (4.5 Device)..
$142.00 $284.00
JEDEC JEP65 (R1999)
TEST PROCEDURES FOR VERIFICATION OF MAXIMUM RATINGS OF POWER TRANSISTORS..
$34.00 $67.00