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  • JEDEC JESD28-1
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JEDEC JESD28-1

  • N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS
  • standard by JEDEC Solid State Technology Association, 09/01/2001
  • Publisher: JEDEC

$27.00$54.00


This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.

Product Details

Published:
09/01/2001
Number of Pages:
14
File Size:
1 file , 55 KB

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