Provide PDF Format

JEDEC JESD28-1

N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS
standard by JEDEC Solid State Technology Association, 09/01/2001
Publisher: JEDEC

$27.00$54.00

Description

This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.

Product Details

Published:: 09/01/2001
Number of Pages:: 14
File Size:: 1 file , 55 KB

Related Products

JEDEC JESD22-A117C

ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST..

$31.00 $62.00

JEDEC JESD28-1

N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS..

$27.00 $54.00

JEDEC JESD22-B115A.01

SOLDER BALL PULL..

$34.00 $67.00

JEDEC JESD8-13

SCALABLE LOW-VOLTAGE SIGNALING FOR 400 MV (SLVS-400)..

$27.00 $53.00