Provide PDF Format
JEDEC JESD28-1
- N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS
- standard by JEDEC Solid State Technology Association, 09/01/2001
- Publisher: JEDEC
$27.00$54.00
This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.
Related Products
JEDEC JESD24-12
THERMAL IMPEDANCE MEASUREMENT FOR INSULATED GATE BIPOLAR TRANSISTORS - (Delta VCE(on) Method)..
$28.00 $56.00
JEDEC JESD84-B45
Embedded Multi-media card (e*MMC), Electrical Standard (4.5 Device)..
$142.00 $284.00
JEDEC JEP65 (R1999)
TEST PROCEDURES FOR VERIFICATION OF MAXIMUM RATINGS OF POWER TRANSISTORS..
$34.00 $67.00