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JEDEC JESD28-1

N-CHANNEL MOSFET HOT CARRIER DATA ANALYSIS
standard by JEDEC Solid State Technology Association, 09/01/2001
Publisher: JEDEC

$27.00$54.00

Description

This addendum provides data analysis examples useful in analyzing MOSFET n-channel hot-carrier-induced degradation data. This addendum to JESD28 (Hot carrier n-channel testing standard) suggests hot-carrier data analysis techniques.

Product Details

Published:: 09/01/2001
Number of Pages:: 14
File Size:: 1 file , 55 KB

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