Provide PDF Format
JEDEC JESD51-3
- LOW EFFECTIVE THERMAL CONDUCTIVITY TEST BOARD FOR LEADED SURFACE MOUNT PACKAGES
- standard by JEDEC Solid State Technology Association, 08/01/1996
- Publisher: JEDEC
$27.00$53.00
This standard describes design requirements for a single layer, leaded surface mount integrated circuit package thermal test board. The standard describes board material and geometry requirements, minimum trace lenghts, trace thickness, and routing considerations. Application includes still air and moving air thermal tests.
Related Products
JEDEC JESD82
DEFINITION OF CDCV857 PLL CLOCK DRIVER FOR REGISTERED DDR DIMM APPLICATIONS..
$30.00 $59.00
JEDEC JESD 24-7 (R2002)
ADDENDUM No. 7 to JESD24 - COMMUTATING DIODE SAFE OPERATING AREA TEST PROCEDURE FOR MEASURING dv/dt ..
$26.00 $51.00