Provide PDF Format
JEDEC JESD6 (R2002)
- MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
- standard by JEDEC Solid State Technology Association, 02/01/1967
- Publisher: JEDEC
$30.00$59.00
This standard gives a test method for measuring transistor capacitance using a three-terminal bridge which employs a guard-circuit that eliminates the effect of extraneous capacitance.
Related Products
