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  • JEDEC JESD659B
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JEDEC JESD659B

  • FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING
  • standard by JEDEC Solid State Technology Association, 02/01/2007
  • Publisher: JEDEC

$28.00$56.00


This method establishes requirements for application of Statistical Reliability Monitoring 'SRM' technology to monitor and improve the reliability of electronic components and subassemblies. The standard also describes the condition under with a monitor may be replaced or eliminated. Formerly known as EIA-659, that superseded JESD29-A (July 1996). Became JESD625-A after revision, September 1999.

Product Details

Published:
02/01/2007
Number of Pages:
15
File Size:
1 file , 140 KB

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