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  • JEDEC JESD89-3A
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JEDEC JESD89-3A

  • TEST METHOD FOR BEAM ACCELERATED SOFT ERROR RATE
  • standard by JEDEC Solid State Technology Association, 11/01/2007
  • Publisher: JEDEC

$36.00$72.00


This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particleinduced SER.

Product Details

Published:
11/01/2007
Number of Pages:
27
File Size:
1 file , 220 KB

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