JEDEC

JEDEC

JEDEC is the global leader in developing open standards for the microelectronics industry. With over 4,000 volunteers representing nearly 300 member companies. JEDEC brings manufacturers and suppliers together on 50 different committees, creating standards to meet the diverse technical and developmental needs of the industry. These collaborations ensure product interoperability, benefiting the industry and ultimately consumers by decreasing time-to-market and reducing product development costs.


JEDEC JEP148B

JEDEC JEP148B

RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY

$39.00 $78.00

JEDEC JEP149

JEDEC JEP149

APPLICATION THERMAL DERATING METHODOLOGIES

$30.00 $59.00

JEDEC JEP150

JEDEC JEP150

STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SUR

$30.00 $60.00

JEDEC JEP150.01

JEDEC JEP150.01

STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SUR

$34.00 $67.00

JEDEC JEP151

JEDEC JEP151

, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power

$31.00 $62.00

JEDEC JEP152

JEDEC JEP152

DDR2 DIMM CLOCK SKEW MEASUREMENT PROCEDURE USING A CLOCK REFERENCE BOARD

$36.00 $72.00

JEDEC JEP153

JEDEC JEP153

CHARACTERIZATION AND MONITORING OF THERMAL STRESS TEST OVEN TEMPURATURES

$30.00 $60.00

JEDEC JEP153A

JEDEC JEP153A

CHARACTERIZATION AND MONITORING OF THERMAL STRESS TEST OVEN TEMPURATURES

$30.00 $60.00

JEDEC JEP154

JEDEC JEP154

GUIDELINE FOR CHARACTERIZING SOLDER BUMP ELECTROMIGRATION UNDER CONSTANT CURRENT AND TEMPERATURE STR

$38.00 $76.00

JEDEC JEP155A.01

JEDEC JEP155A.01

RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION

$46.00 $91.00

JEDEC JEP156

JEDEC JEP156

CHIP-PACKAGE INTERACTION UNDERSTANDING, IDENTIFICATION AND EVALUATION

$34.00 $67.00

JEDEC JEP157

JEDEC JEP157

RECOMMENDED ESD-CDM TARGET LEVELS

$96.00 $191.00

JEDEC JEP158

JEDEC JEP158

3D Chip Stack with Through-Silicon Vias (TSVS): Identifying, Evaluating and Understanding Reliabilit

$31.00 $62.00

JEDEC JEP160

JEDEC JEP160

Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devices

$34.00 $67.00

JEDEC JEP163

JEDEC JEP163

SELECTION OF BURN-IN/LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS

$36.00 $72.00

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