Provide PDF Format

JIS R 1636:1998

Test method for thickness of fine ceramic thin films -- Film thickness by contact probe profilometer
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1998
Publisher: JIS

$15.00$29.00

Product Details

Photometry of white light emitting diode for general lighting -- Part 2: LED modules and LED light e..

$5.00 $10.00

Determination of chlorine in chlorine-containing polymers, copolymers and their compounds..

$20.00 $39.00

Rolling bearings -- Self-aligning thrust roller bearings..

$20.00 $39.00

Measuring methods for ferrite cores for microwave devices..

$34.00 $68.00